특징

- Measuring range : 50μS~20mS
- Applications : Silicon ingot, Silicon bulk, Prismatic shape (JIS code)
- Bulk sizes : Contact us in details

상세설명

- Minority carrier lifetime tester for silicon Ingot
  (잉곳 소수 캐리어 수명 측정장치)

- JIS direct current anodizing method

- Photoconductive decay method

- Global standard model for the lifetime test of silicon bulk

- Data processing by digital oscilloscope and PC
   (dedicated software)