HSBI (High Speed Memory Burn in Tester) is 200MHz / 400MBPS Memory Burn in Tester with 200MHz Pattern generator, Timing generator and Form factors integrated

It provides fail memory and redundancy analysis processor as optional

Test program development tool and data analysis tool are included

Support DDR4 / 5 DRAM, LPDDR, NAND Flash

200MHz Pattern Sequencer

Full Functionality Test 

220A DPS per slot 

C++ Based Test Program 

-20℃ to +150℃, Flexible zone, -40℃option 

2 Chamber 24 slots 



Automation Ready